SEM & X-Ray Analysis

Contaminant Identification Through Analysis Using Scanning Electron Microscope (SEM), X-Ray, and Low Vacuum Imaging Technology

Meissner employs a variety of different instruments to aid in the analysis and identification of contaminants removed from filtered fluids. Through SEM and X-ray analysis, as well as low vacuum imaging of a filter’s surface, MTS can assist customers in identifying both organic and inorganic contaminants removed.

SEM (Scanning Electron Microscope) and X-ray Analysis

SEM technology allows MTS to produce images from the submicron realm, employing a maximum magnification of x300,000. Analysis of these images, such as a used filter membrane’s surface, can help us determine the nature of what is being removed from our customer’s product

An energy dispersive X-ray (EDX) spectrometer allows MTS to perform elemental analysis and identification of inorganic contaminants on the surface being observed. This device detects and measures the energy of X-rays emitted from a sample.

Low Vacuum Imaging

Low vacuum imaging makes it possible to analyze organic materials, such as bacteria or cells, without destroying them. (These specimens can’t be viewed under high vacuum conditions due to high water content and/or nonconductive surfaces.)

SEM & X-Ray Analysis